Double laser fast detection scheme

Detection Solution：

This solution enables the accurate measurement of height differences and thickness dimensions for a wide range of components. This equipment leverages optical imaging and laser technology to perform non-contact measurements. The dual-laser structure enables precise measurement of the Z-axis height, flatness, and thickness of both sides of components.

Key features include:

· Robust Construction: A granite base, high-precision linear guides, a lightweight aluminum alloy frame, and a glass workbench ensure stability and accuracy.

· Advanced Optics: Computer-controlled lighting sources and dual laser sensors provide optimal illumination and precise data capture.

· Precise Motion Control: Precision ball screw transmission ensures smooth and accurate movement.

Measurement application：

It is mainly used in the flatness, height, thickness and radian detection of graphene, graphene wafer carrier, FBC soft board, etc.