3D contour scanning detection scheme
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Application introduction：
Paired with a high-resolution spectral 3D sensor, this detection solution overcomes material and color limitations. It delivers stable measurement results for challenging products like high-brightness, transparent, and multilayer films. By capturing 3D point cloud data and employing advanced software algorithms, the solution accurately measures surface roughness, appearance refinements (e.g., gap differences), multilayer film thickness, and overall surface profiles.
Industry application：
Product Consulting
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400-178-1878
Emerson Measurement Technology (Shenzhen) Co., LTD
Address: IMS Group Industrial Park, No. 149, Second Industrial Avenue, Tangxia Yong Community, Yanluo Street, Baoan District, Shenzhen
Contact information
Shenzhen headquarters：
400-178-1878
Fax：0755-23288906
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